Laser detection method for surface object imperfection

The system designed used a new information concerning a wide range of specimens. It is particularly advantageous for studying tissues, materials, and devices, including semiconductors. Semiconductor laser diode of . 630nm serves as a light source for measurement, with power of 5 mW expansion and collimating optics, camera and computer for analysis were used. In this work, the light source LASER is applied to the work piece, then an image is taken for the work piece by a digital camera, the output of the camera will be processed by a computer program to analyze it and to show any information about the surface. Laser power supply was designed and built with output = 4.5 Volts. The system built give as a powerful tool to test a surface and provide information a bout it with help image processing.